型　  号：NOVA NanoSEM 430

  功　  能：

• 导电和非导电样品的高分辨率形貌观察，并可背散射电子成像
  Morphological observation for conducting and insulating samples with high resolution, and imaging using back-scattered electrons
• 配备Oxford X-Max 80能谱仪，可检测成分、探测成分分布
  Detection and mapping of elements in samples with the Oxford X-Max 80 energy dispersive spectrometer (EDS) equipped

  主要指标：

• 分辨率(Resolution)：≤ 1.0 nm @ 15 kV; ≤ 1.6 nm @ 1.0 kV
• 观察范围(Viewfield)：100 mm ×100 mm
• 样品台倾角(Tilting angles)：-5° ~ + 70°
• 配备能谱仪(EDS)：超大面积电制冷硅飘逸探测器 (Si drift detector with 80 mm² super ATW window electrically cooled )
• 能谱分辨率(Energy resolution)：≦129 eV(MnKα, 40000 cps)

  技术特点：

• 高分辨率
  High resolution
• 非导电样品形貌观察
  Morphological observation of non-conducting materials
• 形貌观察和成分分析可结合
  Combined analysis of morphology and element mapping