论文

Comparative Method to Quantify Dielectric Constant at Nanoscale Using Atomic Force Microscopy

论文编号:

作者:

Reynier I. Revilla

刊物名称:

J. Phys. Chem. C

所属学科:

论文题目英文:

Comparative Method to Quantify Dielectric Constant at Nanoscale Using Atomic Force Microscopy

年:

2014

卷:

118

期:

页:

5556？5562

联系作者:

Yan-Lian Yang, Chen Wang

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影响因子:

参与作者:

备注: